Agronomy Journal -- Index by Author (Jan 2004; Volume 96, Number 1)

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Index by Author: Jan 2004; 96 (1) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Aase, J. K. [Abstract] [Full Text]; Affeldt, Richard P. [Abstract] [Full Text]; Albrecht, Kenneth A. [Abstract] [Full Text]; Avendaño, Felicitas [Abstract] [Full Text]
B: Baker, Dustin A. [Abstract] [Full Text]; Basford, K. E. [Abstract] [Full Text]; Bilbao, Marcelino [Abstract] [Full Text]; Blackmer, Alfred M. [Abstract] [Full Text]; Board, James E. [Abstract] [Full Text]; Boerboom, Chris M. [Abstract] [Full Text]; Brye, Kristofor R. [Abstract] [Full Text]; Bures, Edward J. [Abstract] [Full Text]
C: Cambardella, Cynthia A. [Abstract] [Full Text]; Cao, Weixing [Abstract] [Full Text]; Cartwright, Richard D. [Abstract] [Full Text]; Cherney, Jerome H. [Abstract] [Full Text]; Chong, She-Kong [Abstract] [Full Text]; Cochran, V. L. [Abstract] [Full Text]; Cox, William J. [Abstract] [Full Text]; Crozier, Carl [Abstract] [Full Text]
D: Dai, Tingbo [Abstract] [Full Text]; Davidonis, Gayle H. [Abstract] [Full Text]; Deen, William [Abstract] [Full Text]; DeLacy, I. H. [Abstract] [Full Text]; Delgado, Antonio [Abstract] [Full Text]; Delgado, R. [Abstract] [Full Text]; DeLong, Russell E. [Abstract] [Full Text]; DeVuyst, Eric A. [Abstract] [Full Text]; Dion, Y. [Abstract] [Full Text]; Dobermann, A. [Abstract] [Full Text]; Doran, John W. [Abstract] [Full Text]; Drummond, Scott T. [Abstract] [Full Text]; Dwyer, L. M. [Abstract] [Full Text]
F: Federer, W. T. [Abstract] [Full Text]; Fernandez, Carlos J. [Abstract] [Full Text]; Fitzgerald, Glenn J. [Abstract] [Full Text]; Flowers, Michael [Abstract] [Full Text]; Fraisse, Clyde W. [Abstract] [Full Text]; Frégeau-Reid, J. [Abstract] [Full Text]; Fridgen, Jennifer L. [Abstract] [Full Text]; Fridgen, Jon J. [Abstract] [Full Text]; Fritschi, F. B. [Abstract] [Full Text]
G: Gao, Suduan [Abstract] [Full Text]; Gbur, Edward E., Jr. [Abstract] [Full Text]
H: Halvorson, Ardell D. [Abstract] [Full Text]; Hansen, David J. [Abstract] [Full Text]; Hanson, Jon D. [Abstract] [Full Text]; Hatfield, J. L. [Abstract] [Full Text]; Heiniger, Ronnie [Abstract] [Full Text]; Hendrix, Byron J. [Abstract] [Full Text]; Higley, Leon G. [Abstract] [Full Text]; Hinman, Herbert R. [Abstract] [Full Text]; Huggins, David R. [Abstract] [Full Text]; Hunt, Thomas E. [Abstract] [Full Text]; Hutmacher, R. B. [Abstract] [Full Text]
J: Jiang, Jie [Abstract] [Full Text]; Jiang, P. [Abstract] [Full Text]; Johnson, Ann S. [Abstract] [Full Text]; Johnson, J. M. F. [Abstract] [Full Text]; Johnson, Sven H. [Abstract] [Full Text]; Juergens, Louis A. [Abstract] [Full Text]
K: Keeley, M. P. [Abstract] [Full Text]; Kitchen, Newell R. [Abstract] [Full Text]; Krupinsky, J. M. [Abstract] [Full Text]
L: Landivar, Juan A. [Abstract] [Full Text]; Lares, M. T. [Abstract] [Full Text]; Lewis, Andrew L. [Abstract] [Full Text]; Liebig, Mark A. [Abstract] [Full Text]; Liebig, Mark A. [Abstract] [Full Text]; Liebman, Matt [Abstract] [Full Text]; Linden, D. R. [Abstract] [Full Text]; Liu, Changming [Abstract] [Full Text]; Liu, Weidong [Abstract] [Full Text]; Loecke, Terrance D. [Abstract] [Full Text]; Luchiari, Ariovaldo, Jr. [Abstract] [Full Text]; Luo, Weihong [Abstract] [Full Text]
M: Ma, B. L. [Abstract] [Full Text]; Madsen, Rodney A. [Abstract] [Full Text]; Mallarino, Antonio P. [Abstract] [Full Text]; Mallarino, Antonio P. [Abstract] [Full Text]; Marsh, B. H. [Abstract] [Full Text]; Martin, Todd E. [Abstract] [Full Text]; Martínez, Juan J. [Abstract] [Full Text]; Melakeberhan, Haddish [Abstract] [Full Text]; Merrill, S. D. [Abstract] [Full Text]; Miller, Martin E. [Abstract] [Full Text]; Moser, Lowell E. [Abstract] [Full Text]; Munier, D. J. [Abstract] [Full Text]; Munk, D. S. [Abstract] [Full Text]; Mutch, Dale R. [Abstract] [Full Text]
N: Nass, H. [Abstract] [Full Text]; Nichols, R. L. [Abstract] [Full Text]; Nielsen, David C. [Abstract] [Full Text]; Norman, Richard J. [Abstract] [Full Text]
O: Osmond, Deanna [Abstract] [Full Text]
P: Pan, William L. [Abstract] [Full Text]; Pearson, Calvin H. [Full Text]; Pierce, Francis J. [Abstract] [Full Text]; Pikul, J. L., Jr. [Abstract] [Full Text]; Ping, J. L. [Abstract] [Full Text]; Plant, Richard E. [Abstract] [Full Text]
R: Rains, D. W. [Abstract] [Full Text]; Richard, Tom L. [Abstract] [Full Text]; Roberts, B. A. [Abstract] [Full Text]; Roel, Alvaro [Abstract] [Full Text]; Roget, David K. [Abstract] [Full Text]
S: Sadras, Víctor O. [Abstract] [Full Text]; Scardaci, Steven C. [Abstract] [Full Text]; Schabenberger, Oliver [Abstract] [Full Text]; Schacht, Walter H. [Abstract] [Full Text]; Schepers, Aaron R. [Abstract] [Full Text]; Schepers, James S. [Abstract] [Full Text]; Schillinger, William F. [Abstract] [Full Text]; Shanahan, John F. [Abstract] [Full Text]; Slaton, Nathan A. [Abstract] [Full Text]; Smart, Alexander J. [Abstract] [Full Text]; Stewart, Greg [Abstract] [Full Text]; Sudduth, Kenneth A. [Abstract] [Full Text]
T: Tanaka, D. L. [Abstract] [Full Text]; Tanji, Kenneth K. [Abstract] [Full Text]; Thelen, K. D. [Abstract] [Full Text]; Thelen, Kurt D. [Abstract] [Full Text]; Tollenaar, Matthijs [Abstract] [Full Text]; Travis, R. L. [Abstract] [Full Text]
V: Varco, Jac J. [Abstract] [Full Text]; Vargas, R. N. [Abstract] [Full Text]; Varvel, Gary E. [Abstract] [Full Text]; Voldeng, H. D. [Abstract] [Full Text]; Volesky, Jerry D. [Abstract] [Full Text]; Voorhees, W. B. [Abstract] [Full Text]
W: Weir, B. L. [Abstract] [Full Text]; Weisz, Randall [Abstract] [Full Text]; Wiebold, William J. [Abstract] [Full Text]; Wilhelm, W. W. [Abstract] [Full Text]; Wittry, David J. [Abstract] [Full Text]; Wright, S. D. [Abstract] [Full Text]; Wuebker, Mark A. [Abstract] [Full Text]
X: Xue, Lihong [Abstract] [Full Text]
Y: Yan, W. [Abstract] [Full Text]; Young, Bryan G. [Abstract] [Full Text]; Young, Douglas L. [Abstract] [Full Text]; Young, Douglas L. [Abstract] [Full Text]; Yu, Qiang [Abstract] [Full Text]
Z: Zhang, Xiying [Abstract] [Full Text]; Zhang, Yongqiang [Abstract] [Full Text]; Zhu, Yan [Abstract] [Full Text]

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