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Fig. 2. Maps of three crop yield classes formed by empirical classification procedures: (i) based on mean and CV of yield (MCV-3, Blackmore, 2000), (ii) based on mean and standard deviation of yield (MSD-3), (iii) using t test at 90% probability based on mean and standard deviation of yield difference (T90-3), and (iv) using t test at 60% probability based on mean and standard deviation of yield difference (T60-3). Light colors show high-yielding areas; dark colors show low-yielding areas with high yield variability among years.
