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Published in Agron J 98:1488-1494 (2006)
DOI: 10.2134/agronj2006.0103
© 2006 American Society of Agronomy
677 S. Segoe Rd., Madison, WI 53711 USA
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In-Season Prediction of Corn Grain Yield Potential Using Normalized Difference Vegetation Index

R. K. Teal, B. Tubana, K. Girma, K. W. Freeman, D. B. Arnall, O. Walsh and W. R. Raun*

Department of Plant and Soil Sciences, Oklahoma State Univ., 368 Agricultural Hall, Stillwater, OK, 74078


Figure 1
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  		Fig. 1. Relationship between grain yield and NDVI (normalized difference vegetation index) from V8 sensor measurements for 4 yr and 17 locations, 2002 through 2005. YP0 = yield potential; YP0 calculated = mean + one standard deviation.

 

Figure 2
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  		Fig. 2. Relationship between grain yield and DFP INSEY (degrees from planting in-season estimated yield) from V8 growth stage sensor measurements for 4 yr and 17 locations, 2002 through 2005. YP0 = yield potential; YP0 calculated = mean + one standard deviation.

 

Figure 3
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  		Fig. 3. Relationship between grain yield and GDD INSEY (growing degree day in-season yield potential) from V8 growth stage sensor measurements for 4 yr and 17 locations, 2002 through 2005. YP0 = yield potential; YP0 calculated = mean + one standard deviation.

 

Figure 4
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  		Fig. 4. Relationship between grain yield and NDVI (normalized difference vegetation index) from sensor measurements ranging from 800 to 1000 GDD (growing degree days) for 4 yr and 17 locations, 2002 through 2005. YP0 = yield potential; YP0 calculated = mean + one standard deviation.

 

Figure 5
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  		Fig. 5. Relationship between grain yield and GDD INSEY (growing degree day in-season yield potential) from sensor measurements ranging from 800 to 1000 GDD for 4 yr and 17 locations, 2002 through 2005. YP0 = yield potential; YP0 calculated = mean + one standard deviation.

 




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Copyright © 2006 by the American Society of Agronomy.