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Crop Simulation Models Can be Used as Dryland Cropping Systems Research Tools

S. A. Staggenborg* and R. L. Vanderlip

Dep. of Agron., Kansas State Univ., Manhattan, KS 66506



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Fig. 1. Simulated ({circ}) and measured (•) crop yields from 1961 to 2000, and wheat yields at Tribune, KS, from 1974 to 1987 for (A) wheat in a wheat–sorghum–fallow (WSF) rotation, (B) wheat in a wheat–fallow (WF) rotation, and (C) grain sorghum in WSF rotation.

 


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Fig. 2. Simulated ({square}) and measured ({blacksquare}) grain sorghum yields in continuous grain sorghum and simulated ({circ}) and measured (•) grain sorghum yields in a soybean–sorghum rotation at Belleville, KS, at four N rates from 1982 to 2000.

 


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Fig. 3. Simulated ({circ}) and measured (•) grain sorghum yields and associated errors ({blacktriangleup}) at Belleville, KS, from 1982 to 2000 a (A) continuous grain sorghum and (B) grain sorghum–soybean rotation.

 


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Fig. 4. Simulated ({circ}) and measured (•) soybean yields at Belleville, KS, from 1982 to 2000.

 





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