Agronomy Journal Journal of Natural Resources and Life Sciences Education
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Cluster Analysis of Spatiotemporal Corn Yield Patterns in an Iowa Field

D. B. Jaynes*, T. C. Kaspar, T. S. Colvin and D. E. James

USDA-ARS, National Soil Tilth Lab., 2150 Pammel Dr., Ames, IA 50011



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Fig. 1. Distribution of (a) 224 yield plots, (b) elevation, (c) 0 to 255 gray-scale soil color, and (d) apparent electrical conductivity within a 32-ha field.

 


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Fig. 2. Elevation and spatial distribution of the 224 yield plots in the southern half of the 32-ha field assigned to the five yield clusters.

 


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Fig. 3. Average corn yield by year for each cluster. Years when growing season precipitation was less than the 40-yr average are identified as dry and those greater than the 40-yr average as wet.

 


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Fig. 4. Cluster assignment of the 224 yield plots plotted against the first two canonical composites determined for the field attributes.

 


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Fig. 5. Stretched loading vectors for soil electrical conductivity (EC), soil color (SC), elevation (EL), plan curvature (PL) profile curvature (PR), and slope (SL), and cluster means plotted on the first two rotated canonical composites. The PR vector is obscured by other vectors.

 


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Fig. 6. Spatial distribution of the four yield clusters (Cluster 1&2, toeslope; Cluster 3, footslope; Cluster 4, shoulder; Cluster 5, backslope) across the 32-ha field as predicted from the multiple discriminant analysis and significant field attributes.

 





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