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Correlation of Corn and Soybean Grain Yield with Topography and Soil Properties

^a Dep. of Crop Sciences, Univ. of Illinois, 1102 S. Goodwin Ave., Urbana, IL 61801 USA

View larger version (35K): [in a new window]   Fig. 1 Locations of the studied fields (solid circles) in central Illinois and eastern Indiana along with the weather stations (w) nearest to the fields. The distance between the fields and the weather stations varied from 24 km for HW field to 38 km for RE and RW fields

View larger version (56K): [in a new window]   Fig. 2 Monthly precipitation data for March through September of 1994 to 1997, and historical averages from 1961 to 1990 for the weather stations nearest to the fields for (a) DN, WN, and WS; (b) RE and RW; (c) HW; and (d) FN and FS

View larger version (64K): [in a new window]   Fig. 3 An example of the topographical information obtained from the elevation measurements for DN field using ArcView Spatial Analyst: (a) locations of the elevation measurement sites and the terrain map obtained by inverse distance weighting interpolation of the elevation data; (b), (c) and (d) show the maps of slope, curvature, and flow accumulation, respectively

View larger version (25K): [in a new window]   Fig. 4 Standardized combined corn and soybean yields plotted versus soil OM content for (a) 1994, (b) 1995, (c) 1996, and (d) 1997. Only data from the locations where either consistently low (less than field average) or consistently high (higher than field average) yields were observed during all 4 yr are shown. Correlation coefficients (r) between standardized yields and OM (OM < 3) were statistically significant at

View larger version (18K): [in a new window]   Fig. 5 Correlation coefficients between 1994 to 1997 yields and elevations plotted versus mean field slopes